Lichen Planus Pigmentosus Inversus Caused by Occupational Systemic Sensitization to Metals in a Semiconductor Factory Worker

研究成果: 雜誌貢獻 › 評論/辯論 › 同行評審

ASJC Scopus subject areas

@article{f4ecb5a53f4a44e4ae857abc6d336065,

title = "Lichen Planus Pigmentosus Inversus Caused by Occupational Systemic Sensitization to Metals in a Semiconductor Factory Worker",

author = "Hsu, {Che Yuan} and Donald Liu and Lee, {Woan Ruoh} and Shih, {Yi Hsien}",

year = "2017",

month = sep,

day = "1",

doi = "10.1097/DER.0000000000000292",

language = "English",

volume = "28",

pages = "324--326",

journal = "Dermatitis",

issn = "1710-3568",

publisher = "Mary Ann Liebert Inc.",

number = "5",

}

TY - JOUR

T1 - Lichen Planus Pigmentosus Inversus Caused by Occupational Systemic Sensitization to Metals in a Semiconductor Factory Worker

AU - Hsu, Che Yuan

AU - Liu, Donald

AU - Lee, Woan Ruoh

AU - Shih, Yi Hsien

PY - 2017/9/1

Y1 - 2017/9/1

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UR - http://www.scopus.com/inward/citedby.url?scp=85032468527&partnerID=8YFLogxK

U2 - 10.1097/DER.0000000000000292

DO - 10.1097/DER.0000000000000292

M3 - Comment/debate

AN - SCOPUS:85032468527

SN - 1710-3568

VL - 28

SP - 324

EP - 326

JO - Dermatitis

JF - Dermatitis

IS - 5

ER -