摘要
A promising charge trapping film with crystal embedded material is proposed for future electronic devices. Instead of conventional high-vacuum and expensive tool, this technique adopts very cheaper process of sol-gel spin-coating for fabrication of thin film material in the charge trapping flash memory (CTFM). The crystal from spinodal phase separation is observed for sol-gel thin film at 900 C annealing, and is strongly related to the thickness of the spin-coated thin film. The morphology of the crystal from the ethanol solvent system is in the isolated form, while from 2-propanol solvent is in the interconnected structure. The sol-gel-derived CTFM from ethanol exhibits the better memory performance of retention times for <5 and <10 % charge loss at applied temperature of 25 and 85 C, respectively. The ethanol system CTFM demonstrates a large memory window (~10 V) and good reliability than 2-propanol (~3 V) due to the existence of several isolated crystals in silicon dioxide film.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 423-430 |
| 頁數 | 8 |
| 期刊 | Journal of Materials Science: Materials in Electronics |
| 卷 | 24 |
| 發行號 | 1 |
| DOIs | |
| 出版狀態 | 已發佈 - 1月 2013 |
ASJC Scopus subject areas
- 電子、光磁材料
- 原子與分子物理與光學
- 凝聚態物理學
- 電氣與電子工程
指紋
深入研究「Facile sol-gel preparation of nanocrystal embedded thin film material for memory device」主題。共同形成了獨特的指紋。引用此
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