Does it fit for you? Use the concept of technology acceptance model (TAM) to construct conceptual framework for the 3D mimic fitting of wearing system
Ming Hsu Wang, Bi Hui Chen, Yi Hsueh Yang, Wen Ko Chiou
研究成果: 書貢獻/報告類型 › 會議貢獻
Ming Hsu Wang, Bi Hui Chen, Yi Hsueh Yang, Wen Ko Chiou
研究成果: 書貢獻/報告類型 › 會議貢獻