Figure S1. Verification of the radioresistant phenotype of radioresistant sublines. A total of 500 cells parental (OECM1-Pt, Detroit-Pt, FaDu-Pt) or radioresistant subline cells (OECM1-RR, Detroit-RR, and FaDu-RR) were seeded per well in a 96-well plate and following treated irradiation with various doses (0, 3, and 6 Gy) and continuously cultured for 4 days. The cell survival fractions were assessed using Cell Counting Kit-8. Results were presented as the mean ± standard deviation (SD) from three independent experiments. ***, P