Abstract
Imaging with time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been shown to be a powerful analytical tool for mapping the distribution of biologically relevant small molecules (
Original language | English |
---|---|
Pages (from-to) | 248-250 |
Number of pages | 3 |
Journal | Surface and Interface Analysis |
Volume | 45 |
Issue number | 1 |
DOIs | |
Publication status | Published - Jan 2013 |
Keywords
- HepG2
- TOF-SIMS
- freeze-fracture
- imaging
- powerful magnets
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- Materials Chemistry
- Surfaces, Coatings and Films
- Surfaces and Interfaces