Abstract

Imaging with time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been shown to be a powerful analytical tool for mapping the distribution of biologically relevant small molecules (

Original languageEnglish
Pages (from-to)248-250
Number of pages3
JournalSurface and Interface Analysis
Volume45
Issue number1
DOIs
Publication statusPublished - Jan 2013

Keywords

  • HepG2
  • TOF-SIMS
  • freeze-fracture
  • imaging
  • powerful magnets

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Materials Chemistry
  • Surfaces, Coatings and Films
  • Chemistry(all)
  • Surfaces and Interfaces

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