TY - GEN
T1 - Investigated Raman Spectroscopy of Graphene material properties
AU - Liou, Jian Chiun
AU - Chang, Yi Tsung
AU - Fang, Kuan Wen
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/12/1
Y1 - 2017/12/1
N2 - Raman spectrum of a graphene edge, showing the main raman features, the D band(∼1350 cm-1), G band(∼1580 cm-1) and 2D band (∼2700 cm-1) taken with a laser excitation energy of 2.41 eV. D band is not easy to be found in the good structure of the graphite, generally D band and G band integral intensity ratio ID/IG, to determine whether the carbon material defects and the crystallization of the pros and cons, but D band is usually also the incident light wavelength with the impact of the incident area. The insert voltage conditions with H2SO4 and KOH is demo in the study. The D band and G band integral intensity ratio ID/IG is equal 1.08, and FWHM(cm-1) is equal 97.6 value.
AB - Raman spectrum of a graphene edge, showing the main raman features, the D band(∼1350 cm-1), G band(∼1580 cm-1) and 2D band (∼2700 cm-1) taken with a laser excitation energy of 2.41 eV. D band is not easy to be found in the good structure of the graphite, generally D band and G band integral intensity ratio ID/IG, to determine whether the carbon material defects and the crystallization of the pros and cons, but D band is usually also the incident light wavelength with the impact of the incident area. The insert voltage conditions with H2SO4 and KOH is demo in the study. The D band and G band integral intensity ratio ID/IG is equal 1.08, and FWHM(cm-1) is equal 97.6 value.
KW - Graphene
KW - KOH
KW - Raman spectrum
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U2 - 10.1109/EDSSC.2017.8333243
DO - 10.1109/EDSSC.2017.8333243
M3 - Conference contribution
AN - SCOPUS:85045526556
VL - 2017-January
T3 - EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
SP - 1
EP - 2
BT - EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017
Y2 - 18 October 2017 through 20 October 2017
ER -