Correction: Formation and characterization of the high precision nanoscale thin film resistors on radio frequency application [Int. J. Electrochem. Sci., 10 (2015) (6517-6526)]

Huei Yu Huang; Chia-Yu Wu; Chi Chang Wu

doi:10.20964/2018.06.200

Correction: Formation and characterization of the high precision nanoscale thin film resistors on radio frequency application [Int. J. Electrochem. Sci., 10 (2015) (6517-6526)]

Research output: Contribution to journal › Comment/debate › peer-review

Abstract

This was not noticed at the time by the authors and it is corrected by this correction now, and we apologize for any inconvenience this may cause.

Original language	English
Pages (from-to)	6155
Number of pages	1
Journal	International Journal of Electrochemical Science
Volume	13
Issue number	6
DOIs	https://doi.org/10.20964/2018.06.200
Publication status	Published - Jun 1 2018

ASJC Scopus subject areas

Electrochemistry

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10.20964/2018.06.200

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Correction: Formation and characterization of the high precision nanoscale thin film resistors on radio frequency application [Int. J. Electrochem. Sci., 10 (2015) (6517-6526)]. / Huang, Huei Yu ; Wu, Chia-Yu; Wu, Chi Chang.
In: International Journal of Electrochemical Science, Vol. 13, No. 6, 01.06.2018, p. 6155.

Research output: Contribution to journal › Comment/debate › peer-review

@article{bb443efc54dc45fb9b22da2a97a89c1f,

title = "Correction: Formation and characterization of the high precision nanoscale thin film resistors on radio frequency application [Int. J. Electrochem. Sci., 10 (2015) (6517-6526)]",

abstract = "This was not noticed at the time by the authors and it is corrected by this correction now, and we apologize for any inconvenience this may cause.",

author = "Huang, {Huei Yu} and Chia-Yu Wu and Wu, {Chi Chang}",

note = "Publisher Copyright: {\textcopyright} 2018 The Authors.",

year = "2018",

month = jun,

day = "1",

doi = "10.20964/2018.06.200",

language = "English",

volume = "13",

pages = "6155",

journal = "International Journal of Electrochemical Science",

issn = "1452-3981",

publisher = "Elsevier B.V.",

number = "6",

}

TY - JOUR

T1 - Correction

T2 - Formation and characterization of the high precision nanoscale thin film resistors on radio frequency application [Int. J. Electrochem. Sci., 10 (2015) (6517-6526)]

AU - Huang, Huei Yu

AU - Wu, Chia-Yu

AU - Wu, Chi Chang

PY - 2018/6/1

Y1 - 2018/6/1

N2 - This was not noticed at the time by the authors and it is corrected by this correction now, and we apologize for any inconvenience this may cause.

AB - This was not noticed at the time by the authors and it is corrected by this correction now, and we apologize for any inconvenience this may cause.

UR - http://www.scopus.com/inward/record.url?scp=85048298352&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85048298352&partnerID=8YFLogxK

U2 - 10.20964/2018.06.200

DO - 10.20964/2018.06.200

M3 - Comment/debate

AN - SCOPUS:85048298352

SN - 1452-3981

VL - 13

SP - 6155

JO - International Journal of Electrochemical Science

JF - International Journal of Electrochemical Science

IS - 6

ER -

Correction: Formation and characterization of the high precision nanoscale thin film resistors on radio frequency application [Int. J. Electrochem. Sci., 10 (2015) (6517-6526)]

Abstract

ASJC Scopus subject areas

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