Bridging fault diagnosis to identify the layer of systematic defects

Po Juei Chen, James Chien-Mo Li, Hsing-Jasmine Chao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)


Diagnosis for systematic defects is very critical for yield learning in nanometer technology. This paper presents a bridging fault diagnosis which identifies a single layer of systematic defects (LSD), where more than expected numbers of bridging faults are located. The proposed technique is a layout-aware diagnosis which contains bridging pair extraction, structural analysis, and layer-oriented covering. Instead of treating each failing CUT independently, a statistical method (Z-test) is applied to diagnose all CUTs simultaneously. Experiments on six of seven large ISCAS'89 benchmark circuits successfully diagnose LSD for single bridging fault as well as multiple bridging faults.

Original languageEnglish
Title of host publicationProceedings of the Asian Test Symposium
Number of pages6
Publication statusPublished - 2009
Event18th Asian Test Symposium, ATS 2009 - Taichung, Taiwan
Duration: Nov 23 2009Nov 26 2009


Other18th Asian Test Symposium, ATS 2009

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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